Physical Failure Analysis (PFA)

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【TESCAN】 FIB-SEM

【TESCAN】 FIB-SEM

TESCAN SOLARIS is a turn-key FIB-SEM solution for the fabrication of nanostructures and nanotechnology-inspired microscale functional devices. TESCAN SOLARIS combines the most precise Focused Ion Beam with UHR-SEM featuring TriLens™ immersion optics, to ensure the best possible connection between ion beam milling and ultra-high-resolution SEM imaging. Powerful TESCAN Essence™ software allows users to customize the GUI for specific applicationworkflows and to accommodate user expertise or preferences. TESCAN SOLARIS is easy to implement in failure analysis labs and semiconductor R&D labs that assess the production quality of semiconductor devices.

 

【Features】

  • Best-in-class ion beam performance
  • Crossover-free ultra-high resolution SEM imaging
  • High precision nanopatterning engine for electron and ion beams
  • Multiple gas injection system options with a variety of precursor gases
  • Chamber extension options for up to 12“ wafer inspection
  • Easy-to-use modular software user interface
  • Python scripting interface for advanced user-defined experiments

 

【Technical Specifications】

Electron Optics
Electron Gun
High brightness Schottky emitter
Electron Optics
Triglav™ column
Resolution
Standard mode
0.6 nm at 15 keV
1.2 nm at 1 keV
Beam Deceleration mode
0.9 nm at 1 keV
STEM
0.5 nm at 30 keV
Maximum Field of View
>10 mm at max. WD
Electron Beam Energy
50 eV to 30 keV
Probe Current
Up to 400 nA
Ion Optics
Ion Column
Orage™
Ion Gun
Gallium liquid metal ion source
Resolution
< 2.5 nm at 30 keV
Ion Beam Energy
500 eV to 30 keV
Probe Current
< 1 pA to 100 nA
SEM-FIB Coincidence at
WDSEM = 5 mm

 

 

TESCAN is a multinational company specializing in scientific instruments for micro morphology, structure and composition analysis. It is a world-renowned electronic micro instrument manufacturer. Its headquarters are located in the world's largest electron microscope manufacturing base - Brno, Czech Republic. Its products mainly include electron microscope, focused ion beam system, multi-channel holographic microscope and relevant analysis accessories and software, which are widely used in medicine, biology, biochemistry, agriculture, material science, metallurgy, chemistry, petroleum, pharmacy, semiconductor, electronic devices and other fields.