The nanoprobe is an essential tool for electrical characteristics measurement in advanced semiconductor manufacturing processes. It is widely used in research and development stages as well as for failure analysis. As processes have progressed to 10nm and below, the requirements for probe specifications have become increasingly demanding. ALES TECH is capable of providing high-quality nanoprobes, with the probe tip positioned within 50nm and a probe diameter smaller than 30nm, meeting the demands for failure analysis in 3nm manufacturing processes.
ALES TECH, founded by accomplished researchers who departed from the Institute of Physics of the Academia Sinica, specializes in surface science and electrochemical technology. Guided by the pioneering work of Academia Sinica academician Dr. Tien Tzou Tsong in Single Atom Tip (SAT) exploration, ALES TECH was established in Kaohsiung in 2019, with authorized patents and technologies from Academia Sinica. The core business includes supplying indispensable probe products spanning nanometer to micrometer scales for semiconductor wafer and panel electrical verification, and developing Gas Field Ion Source Focused Ion Beam (GFIS-FIB) equipment, an optimal solution for circuit repair and failure analysis in advanced semiconductor processes. For more details, please visit www.alestech.tw.
