ALES TECH specializes in producing user-friendly STM (Scanning Tunneling Microscope) probes, addressing the issue of unstable probe quality often encountered in typical STM laboratories. In addition to the common tungsten STM probes, ALES TECH also offers STM probes made from special metallic materials, such as the more durable platinum-iridium alloy (PtIr) probes and ferromagnetic nickel (Ni) probes.
ALES TECH, founded by accomplished researchers who departed from the Institute of Physics of the Academia Sinica, specializes in surface science and electrochemical technology. Guided by the pioneering work of Academia Sinica academician Dr. Tien Tzou Tsong in Single Atom Tip (SAT) exploration, ALES TECH was established in Kaohsiung in 2019, with authorized patents and technologies from Academia Sinica. The core business includes supplying indispensable probe products spanning nanometer to micrometer scales for semiconductor wafer and panel electrical verification, and developing Gas Field Ion Source Focused Ion Beam (GFIS-FIB) equipment, an optimal solution for circuit repair and failure analysis in advanced semiconductor processes. For more details, please visit www.alestech.tw.
