After evaluating several alternatives ChipMOS has selected Xcerra's total test cell solution as their preferred test platform for high volume production of MEMS devices at its Shanghai facility. ChipMOS is now well prepared to support further MEMS fabless
Multitest's InBaro test module for barometric sensors continues to expand its footprint in the growing MEMS and sensor market. The Multitest InBaro was recently shipped on a repeat order to a major European semiconductor manufacturer expanding the capacit
Multitest MEMS test equipment is based on a modular design, which combines well established handling equipment with state-of-the-art test and calibration modules dedicated to the specific application. This approach offers proven benefits for the test qual
DCG Systems today announced the release of the Meridian M system for isolation of routine and challenging electrical faults at the wafer level. Offering photon emission for transistor-level defects and leakage, and a complete portfolio of static laser sti
Xcerra finalized the installation of a complete test cell for 3/6DOF inertial and navigation MEMS applications at an Asian customer. The test cell leverages proven Xcerra expertise in highly parallel test of sensor devices, delivered through the LTX-Crede
Multitest announces that its new high power Kelvin contactor for strip test successfully passed a long term evaluation for a high volume automotive application at an Asian manufacturing site of a global IDM. The outstanding yield and contactor pin lifespa
Multitest has shipped the first MT9510 pick and place handler for testing high voltage applications up to 10 kV (peak). A complete solution can be provided through Multitest's Plug & Yield program which includes a Multitest high power contactor. The entir
Multitest's well-established MT9510 tri-temp pick and place handler is now available with various site pitch layouts, which are compatible with major standard handlers in the market. The new site pitch layouts enable to customer to re-use existing loadboa
