Multitest announces that its new high power Kelvin contactor for strip test successfully passed a long term evaluation for a high volume automotive application at an Asian manufacturing site of a global IDM. The outstanding yield and contactor pin lifespan enable extraordinary OEE (overall equipment efficiency) and a lower overall cost of test.
The evaluation ran for over a year using a SO150 package for a high current automotive application requiring very high volumes. The results proved the outstanding performance of this contacting solution: >99% first pass yield and a contact pin life span of more than 1 million insertions.
The Multitest High Current Strip Contactor addresses two critical requirements: high power carrying capability and the limited space in a high parallel test set up. Usually, strip contactors are based on vertical probe designs, which cannot meet the electrical and thermal requirements of high current applications. The new contactor is based on the established Multitest ecoAmp Cantilever design and deliveries superior electrical performance and temperature accuracy.
For more information about Multitest’s ecoAmp™ contactors, visit www.multitest.com/ecoAmp.
About Multitest
Multitest (headquartered in Rosenheim, Germany) is one of the world’s leading manufacturers of semiconductor material handling equipment and interfaces for the testing and calibration of semiconductors and sensors. Multitest markets a broad portfolio of innovative and performance driven test handlers, contactors and ATE printed circuit boards. Multitest has more than 30 years of experience in the semiconductor industry, providing solutions to the automotive, consumer, communication, and sensor markets. Multitest is a company of Xcerra™ Corporation, which provides capital equipment, interface products, and services to the semiconductor, industrial, and electronics manufacturing industries. Xcerra Corporation offers a comprehensive portfolio of solutions and technologies, and a global network of strategically deployed applications and support resources. Additional information can be found at www.multitest.com and www.Xcerra.com
